Authors: Sarnowski, M Vaupel, T Hansen, V Kreysa, E Gemuend, HP

Citation: M. Sarnowski et al., Characterization of diffraction anomalies in 2-D photonic bandgap structures, IEEE MICR T, 49(10), 2001, pp. 1868-1872

Authors: Sarnowski, M Vaupel, T Hansen, V

Citation: M. Sarnowski et al., Numerical confirmation of scattering anomalies observed in FSS applications, FREQUENZ, 55(1-2), 2001, pp. 51-58