Citation: M. Guendouz et al., Effect of crystallographic directions on porous silicon formation on patterned substrates, MAT SCI E B, 69, 2000, pp. 43-47
Authors:
Guillet, D
Sarret, M
Haji, L
Rogel, R
Bonnaud, O
Citation: D. Guillet et al., Crystallization of amorphous silicon-germanium films deposited by low pressure chemical vapor deposition, J NON-CRYST, 266, 2000, pp. 689-693
Authors:
Mourgues, K
Rahal, A
Mohammed-Brahim, T
Sarret, M
Kleider, JP
Longeaud, C
Bachrouri, A
Romano-Rodriguez, A
Citation: K. Mourgues et al., Density of states in the channel material of low temperature polycrystalline silicon thin film transistors, J NON-CRYST, 266, 2000, pp. 1279-1283
Authors:
Rogel, R
Sarret, M
Mohammed-Brahim, T
Bonnaud, O
Kleider, JP
Citation: R. Rogel et al., High quality unhydrogenated low-pressure chemical vapor deposited polycrystalline silicon, J NON-CRYST, 266, 2000, pp. 141-145
Authors:
Briand, D
Sarret, M
Kis-Sion, K
Mohammed-Brahim, T
Duverneuil, P
Citation: D. Briand et al., In situ doping of silicon deposited by LPCVD: pressure influence on dopantincorporation mechanisms, SEMIC SCI T, 14(2), 1999, pp. 173-180
Authors:
Velichenko, AB
Portillo, J
Sarret, M
Muller, C
Citation: Ab. Velichenko et al., Surface analysis of films formed on a zinc anode in a Zn-Ni electroplatingbath, APPL SURF S, 148(1-2), 1999, pp. 17-23
Authors:
Elkhatabi, F
Benballa, M
Sarret, M
Muller, C
Citation: F. Elkhatabi et al., Dependence of coating characteristics on deposition potential for electrodeposited Zn-Ni alloys, ELECTR ACT, 44(10), 1999, pp. 1645-1653
Citation: G. Barcelo et al., Characterization of zinc-nickel alloys obtained from an industrial chloride bath, J APPL ELEC, 28(10), 1998, pp. 1113-1120