Authors:
Maxson, JB
Perkins, N
Savage, DE
Woll, AR
Zhang, L
Kuech, TF
Lagally, MG
Citation: Jb. Maxson et al., Novel dark-field imaging of GaN {0001} surfaces with low-energy electron microscopy, SURF SCI, 464(2-3), 2000, pp. 217-222
Authors:
Li, J
Mirabedini, A
Mawst, LJ
Savage, DE
Matyi, RJ
Kuech, TF
Citation: J. Li et al., Effect of interface roughness on performance of AlGaAs/InGaAs/GaAs resonant tunneling diodes, J CRYST GR, 195(1-4), 1998, pp. 617-623