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Results: 1-3 |
Results: 3
Development of a silicon-based nanoprobe system for 3-D measurements
Authors: Haitjema, H Pril, WO Schellekens, PHJ
Citation: H. Haitjema et al., Development of a silicon-based nanoprobe system for 3-D measurements, CIRP ANN-M, 50(1), 2001, pp. 365-368
Assessing geometrical errors of multi-axis machines by three-dimensional length measurements
Authors: Florussen, GHJ Delbressine, FLM van de Molengraft, MJG Schellekens, PHJ
Citation: Ghj. Florussen et al., Assessing geometrical errors of multi-axis machines by three-dimensional length measurements, MEASUREMENT, 30(4), 2001, pp. 241-255
Calibration of displacement sensors up to 300 mu m with nanometre accuracyand direct traceability to a primary standard of length
Authors: Haitjema, H Schellekens, PHJ Wetzels, SFCL
Citation: H. Haitjema et al., Calibration of displacement sensors up to 300 mu m with nanometre accuracyand direct traceability to a primary standard of length, METROLOGIA, 37(1), 2000, pp. 25-33
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