Authors:
Schicketanz, M
Oelsner, A
Morais, J
Mergel, V
Schmidt-Bocking, H
Schonhense, G
Citation: M. Schicketanz et al., Electron-TOF-analyser for complete momentum analysis in photoemission fromsurfaces, NUCL INST A, 467, 2001, pp. 1519-1522
Authors:
Oelsner, A
Schmidt, O
Schicketanz, M
Klais, M
Schonhense, G
Mergel, V
Jagutzki, O
Schmidt-Bocking, H
Citation: A. Oelsner et al., Microspectroscopy and imaging using a delay line detector in time-of-flight photoemission microscopy, REV SCI INS, 72(10), 2001, pp. 3968-3974
Authors:
Oelsner, A
Fecher, GH
Schicketanz, M
Schonhense, G
Citation: A. Oelsner et al., Determining the optical properties of adsorbate covered surfaces by dichroism in VUV-photoemission, SURF SCI, 435, 1999, pp. 53-57