Authors: Heinisch, C Piplits, K Kubel, F Schintlmeister, A Pfluger, E Hutter, H

Citation: C. Heinisch et al., SIMS investigation of MoS2 based sputtercoatings, APPL SURF S, 179(1-4), 2001, pp. 269-274

Authors: Gritsch, M Brunner, C Piplits, K Hutter, H Wilhartitz, P Schintlmeister, A Martinz, HP

Citation: M. Gritsch et al., Application of scanning SIMS techniques for the evaluation of the oxidation behavior of high-purity molybdenum, FRESEN J AN, 365(1-3), 1999, pp. 188-194