Authors: Bohne, W Rohrich, J Schmidt, M Schopke, A Selle, B Wurz, R

Citation: W. Bohne et al., Composition and morphology studies of ultrathin CaF2 epitaxial films on silicon, APPL SURF S, 179(1-4), 2001, pp. 73-78

Authors: Bohne, W Reinsperger, GU Rohrich, J Schopke, A Selle, B Sieber, I Stauss, P Urban, I

Citation: W. Bohne et al., Analysis of Co and Cr dopants in epitaxial films of beta-FeSi2 by ERDA, RBS, EDX and AES, FRESEN J AN, 365(1-3), 1999, pp. 258-262

Authors: Fenske, F Fuhs, W Nebauer, E Schopke, A Selle, B Sieber, I

Citation: F. Fenske et al., Transparent conductive ZnO : Al films by reactive co-sputtering from separate metallic Zn and Al targets, THIN SOL FI, 344, 1999, pp. 130-133