Authors: Windeln, J Bram, C Eckes, HL Hammel, D Huth, J Marien, J Rohl, H Schug, C Wahl, M Wienss, A

Citation: J. Windeln et al., Applied surface analysis in magnetic storage technology, APPL SURF S, 179(1-4), 2001, pp. 167-180

Authors: Scheuerlein, H Schug, C Schneider, C Kockerling, F

Citation: H. Scheuerlein et al., Abdominal wall recurrence - Etiology and precautions, MINIMALLY INVASIVE CANCER MANAGEMENT, 2001, pp. 56-74

Authors: Bartsch, DK Hasse, C Schug, C Barth, P Rothmund, M Hoppner, W

Citation: Dk. Bartsch et al., A RET double mutation in the germline of a kindred with FMTC, EXP CL E D, 108(2), 2000, pp. 128-132

Authors: Schug, C Schempp, S Lamparter, P Steeb, S

Citation: C. Schug et al., Surface roughness of sputter-deposited gold films: a combined X-ray technique and AFM study, SURF INT AN, 27(7), 1999, pp. 670-677