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Results:
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Results: 4
Interface properties of Alq(3)/TPD on sputter-cleaned ITO
Authors:
Peisert, H Schwieger, T Knupfer, M Golden, MS Fink, J
Citation:
H. Peisert et al., Interface properties of Alq(3)/TPD on sputter-cleaned ITO, SYNTH METAL, 121(1-3), 2001, pp. 1435-1436
Electronic structure of K-intercalated 8-tris-hydroxyquinoline aluminum studied by photoemission spectroscopy - art. no. 165104
Authors:
Schwieger, T Peisert, H Knupfer, M Golden, MS Fink, J
Citation:
T. Schwieger et al., Electronic structure of K-intercalated 8-tris-hydroxyquinoline aluminum studied by photoemission spectroscopy - art. no. 165104, PHYS REV B, 6316(16), 2001, pp. 5104
Order on disorder: Copper phthalocyanine thin films on technical substrates
Authors:
Peisert, H Schwieger, T Auerhammer, JM Knupfer, M Golden, MS Fink, J Bressler, PR Mast, M
Citation:
H. Peisert et al., Order on disorder: Copper phthalocyanine thin films on technical substrates, J APPL PHYS, 90(1), 2001, pp. 466-469
Interface properties of organic/indium-tin oxide and organic/GeS(001) studied using photoemission spectroscopy
Authors:
Peisert, H Schwieger, T Knupfer, M Golden, MS Fink, J
Citation:
H. Peisert et al., Interface properties of organic/indium-tin oxide and organic/GeS(001) studied using photoemission spectroscopy, J APPL PHYS, 88(3), 2000, pp. 1535-1540
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