Authors: See, KY Jelinsky, SA Loechler, EL

Citation: Ky. See et al., Factors that influence the mutagenic patterns of DNA adducts from chemicalcarcinogens, MUT RES-R M, 463(3), 2000, pp. 215-246

Authors: See, KY Ma, JG

Citation: Ky. See et Jg. Ma, Electromagnetic radiation from printed-circuit structure with extended conductor, MICROW OPT, 27(2), 2000, pp. 118-120

Authors: Ma, JG Chia, TK Tan, TW See, KY

Citation: Jg. Ma et al., Electromagnetic wave scattering from 2-D cylinder by using the method of lines, MICROW OPT, 24(4), 2000, pp. 275-277

Authors: See, KY Yang, L

Citation: Ky. See et L. Yang, Measurement of noise source impedance of SMPS using two current probes, ELECTR LETT, 36(21), 2000, pp. 1774-1776

Authors: See, KY Freeman, EM

Citation: Ky. See et Em. Freeman, Rigorous approach to modelling electromagnetic radiation from finite-size printed circuit structures, IEE P-MIC A, 146(1), 1999, pp. 29-34

Authors: See, KY

Citation: Ky. See, Network for conducted EMI diagnosis, ELECTR LETT, 35(17), 1999, pp. 1446-1447