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Results: 1-7 |
Results: 7

Authors: Senden, TJ
Citation: Tj. Senden, Force microscopy and surface interactions, CURR OP COL, 6(2), 2001, pp. 95-101

Authors: Wangerek, LA Dahl, HHM Senden, TJ Carlin, JB Jans, DA Dunstan, DE Ioannou, PA Williamson, R Forrest, SM
Citation: La. Wangerek et al., Atomic force microscopy imaging of DNA - cationic liposome complexes optimised for gene transfection into neuronal cells, J GENE MED, 3(1), 2001, pp. 72-81

Authors: Craig, VSJ Jones, AC Senden, TJ
Citation: Vsj. Craig et al., Contact angles of aqueous solutions on copper surfaces bearing self-assembled monolayers, J CHEM EDUC, 78(3), 2001, pp. 345-346

Authors: Senden, TJ Di Meglio, JM Silberzan, I
Citation: Tj. Senden et al., The conformation of adsorbed polyacrylamide and derived polymers, CR AC S IV, 1(9), 2000, pp. 1143-1152

Authors: Maeda, N Senden, TJ
Citation: N. Maeda et Tj. Senden, A method for the calibration of force microscopy cantilevers via hydrodynamic drag, LANGMUIR, 16(24), 2000, pp. 9282-9286

Authors: Senden, TJ Knackstedt, MA Lyne, MB
Citation: Tj. Senden et al., Droplet penetration into porous networks: Role of pore morphology, NORD PULP P, 15(5), 2000, pp. 554-563

Authors: Lu, WJ Baldwin, KGH Hoogerland, MD Buckman, SJ Senden, TJ Sheridan, TE Boswell, RW
Citation: Wj. Lu et al., Sharp edged silicon structures generated using atom lithography with metastable helium atoms, J VAC SCI B, 16(6), 1998, pp. 3846-3849
Risultati: 1-7 |