Authors: Lee, WP Seow, WS Yow, HK Tou, TY

Citation: Wp. Lee et al., Analysis of atomic force microscopy images of crystal originated "particles" on silicon wafers treated with NH4OH : H2O2 : H2O solution, JPN J A P 1, 40(1), 2001, pp. 18-23

Authors: Lee, WP Khong, YL Seow, WS

Citation: Wp. Lee et al., Modelling the ultraviolet irradiation effect on the effective minority carrier recombination lifetime of silicon wafers, J APPL PHYS, 85(2), 1999, pp. 994-1001