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Results:
1-6
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Results: 6
How to measure surface properties
Authors:
Heaton, MG Serry, FM
Citation:
Mg. Heaton et Fm. Serry, How to measure surface properties, R&D MAG, 43(6), 2001, pp. 28-29
Judging AFM performance
Authors:
Serry, FM Thornton, JT Kjoller, K
Citation:
Fm. Serry et al., Judging AFM performance, R&D MAG, 42(8), 2000, pp. 53-53
Electric force microscopy & surface potential imaging
Authors:
Serry, FM Kjoller, K Thorgon, JT Tench, RJ Cook, D
Citation:
Fm. Serry et al., Electric force microscopy & surface potential imaging, ADV MATER P, 158(5), 2000, pp. 48-51
AFM dares us to question what we 'know' about the surface
Authors:
Serry, FM
Citation:
Fm. Serry, AFM dares us to question what we 'know' about the surface, SURF ENG, 16(4), 2000, pp. 273-274
Atomic force profilometry and long scan atomic force microscopy: New techniques for characterisation of surfaces
Authors:
Cunningham, T Serry, FM Ge, LM Gotthard, D Dawson, DJ
Citation:
T. Cunningham et al., Atomic force profilometry and long scan atomic force microscopy: New techniques for characterisation of surfaces, SURF ENG, 16(4), 2000, pp. 295-298
Surface characterisation using atomic force microscopy
Authors:
Serry, FM Strausser, YE Elings, J Magonov, S Thornton, J Ge, L
Citation:
Fm. Serry et al., Surface characterisation using atomic force microscopy, SURF ENG, 15(4), 1999, pp. 285-290
Risultati:
1-6
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