Authors:
Mourokh, LG
Malikova, L
Pollak, FH
Shi, BQ
Nguyen, C
Citation: Lg. Mourokh et al., Photoreflectance characterization of an AlInAs/GaInAs heterojunction bipolar transistor structure with a chirped superlattice, J APPL PHYS, 89(4), 2001, pp. 2500-2502
Citation: Bq. Shi et Cw. Tu, Evaluation of temperature rise on semiconductor surfaces associated with scanning Ar+ lasers, J CRYST GR, 217(1-2), 2000, pp. 82-90
Citation: Bq. Shi et Cw. Tu, Investigations on the mechanisms responsible for Ar+-laser-induced growth enhancement of GaAs by chemical beam epitaxy, J CRYST GR, 217(1-2), 2000, pp. 91-101
Citation: Bq. Shi et Cw. Tu, A reaction model for chemical beam epitaxy with triethylgallium and tris(dimethylamino)arsenic, J CRYST GR, 216(1-4), 2000, pp. 87-96
Citation: Bq. Shi et Cw. Tu, Experimental and numerical studies of Ar+-laser-assisted Si doping of GaAswith SiBr4 by chemical beam epitaxy, J CRYST GR, 210(4), 2000, pp. 444-450
Citation: Yn. Zhu et al., The isotopic compositions of molecular nitrogen: implications on their origins in natural gas accumulations, CHEM GEOL, 164(3-4), 2000, pp. 321-330
Citation: M. Kondow et al., Chemical beam etching of GaAs using a novel precursor of tertiarybutylchloride (TBCl), JPN J A P 2, 38(6AB), 1999, pp. L617-L619
Citation: Bq. Shi et Cw. Tu, Modeling study of silicon incorporation from SiBr4 in GaAs layers grown bychemical beam epitaxy, J CRYST GR, 195(1-4), 1998, pp. 740-745