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Citation: Wm. Chen et al., Quality assessment of sapphire wafers for X-ray crystal optics using whitebeam Synchrotron X-Ray Topography, PHYS ST S-A, 186(3), 2001, pp. 365-371

Authors: Kohn, VG Shvydko, YV Gerdau, E

Citation: Vg. Kohn et al., On the theory of an X-ray Fabry-Perot interferometer, PHYS ST S-B, 221(2), 2000, pp. 597-615