Authors:
Sudo, S
Nagayama, Y
Emoto, M
Goto, M
Hamada, Y
Ida, K
Ido, T
Iguchi, H
Inagaki, S
Isobe, M
Kawahata, K
Khlopenkov, K
Masuzaki, S
Minami, T
Morita, S
Muto, S
Nakanishi, H
Narihara, K
Nishizawa, A
Ohdachi, S
Osakabe, M
Ozaki, T
Peterson, BJ
Sakakibara, S
Sasao, M
Sato, K
Shoji, M
Tanaka, K
Toi, K
Tokuzawa, T
Watanabe, K
Watanabe, T
Yamada, I
Ashikawa, N
Kobuchi, T
Liang, Y
Tamura, N
Sasao, H
Ejiri, A
Okajima, S
Mase, A
Tsuji-Iio, S
Akiyama, T
Zanza, V
Bracco, G
Sibio, A
Tilia, B
Krasilnikov, AV
Lyon, JF
Vyacheslavov, LN
Wurden, GA
Citation: S. Sudo et al., Overview of large helical device diagnostics (invited), REV SCI INS, 72(1), 2001, pp. 483-491