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Results: 1-10 |
Results: 10
Electrochemical intercalation of perchlorate ions in HOPG: an SFM/LFM and XPS study
Authors: Schnyder, B Alliata, D Kotz, R Siegenthaler, H
Citation: B. Schnyder et al., Electrochemical intercalation of perchlorate ions in HOPG: an SFM/LFM and XPS study, APPL SURF S, 173(3-4), 2001, pp. 221-232
Local pH-controlled reactivity investigations by thin-layer scanning tunnelling microscopy
Authors: Ammann, E Beuret, C Indermuhle, PF Kotz, R de Rooij, NF Siegenthaler, H
Citation: E. Ammann et al., Local pH-controlled reactivity investigations by thin-layer scanning tunnelling microscopy, ELECTR ACT, 47(1-2), 2001, pp. 327-334
Electrochemical SPM investigation of the solid electrolyte interphase filmformed on HOPG electrodes
Authors: Alliata, D Kotz, R Novak, P Siegenthaler, H
Citation: D. Alliata et al., Electrochemical SPM investigation of the solid electrolyte interphase filmformed on HOPG electrodes, ELECTROCH C, 2(6), 2000, pp. 436-440
Investigations of the surface morphology of La2CuO4 MBE-grown thin films before and after electrochemical oxidation
Authors: Daridon, A Fompeyrine, J Locquet, JP Musil, C Siegenthaler, H
Citation: A. Daridon et al., Investigations of the surface morphology of La2CuO4 MBE-grown thin films before and after electrochemical oxidation, SURF SCI, 465(1-2), 2000, pp. 149-162
Electrochemical preparation and surface properties of gold nanowire arraysformed by the template technique
Authors: Forrer, P Schlottig, F Siegenthaler, H Textor, M
Citation: P. Forrer et al., Electrochemical preparation and surface properties of gold nanowire arraysformed by the template technique, J APPL ELEC, 30(5), 2000, pp. 533-541
Anion intercalation into highly oriented pyrolytic graphite studied by electrochemical atomic force microscopy
Authors: Alliata, D Haring, P Haas, O Kotz, R Siegenthaler, H
Citation: D. Alliata et al., Anion intercalation into highly oriented pyrolytic graphite studied by electrochemical atomic force microscopy, ELECTROCH C, 1(1), 1999, pp. 5-9
In situ atomic force microscopy of electrochemically activated glassy carbon
Authors: Alliata, D Haring, P Haas, O Kotz, R Siegenthaler, H
Citation: D. Alliata et al., In situ atomic force microscopy of electrochemically activated glassy carbon, EL SOLID ST, 2(1), 1999, pp. 33-35
Structures of surfactant films: a scanning force microscopy study
Authors: Grunder, R Gehr, P Bachofen, H Schurch, S Siegenthaler, H
Citation: R. Grunder et al., Structures of surfactant films: a scanning force microscopy study, EUR RESP J, 14(6), 1999, pp. 1290-1296
In situ AFM study of interlayer spacing during anion intercalation into HOPG in aqueous electrolyte
Authors: Alliata, D Kotz, R Haas, O Siegenthaler, H
Citation: D. Alliata et al., In situ AFM study of interlayer spacing during anion intercalation into HOPG in aqueous electrolyte, LANGMUIR, 15(24), 1999, pp. 8483-8489
History and economy after the cultural change
Authors: Siegenthaler, H
Citation: H. Siegenthaler, History and economy after the cultural change, GESCH GES, 25(2), 1999, pp. 276-301
Risultati: 1-10 |