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Results: 1-12 |
Results: 12
New tools for surface second-harmonic generation
Authors: Simpson, GJ
Citation: Gj. Simpson, New tools for surface second-harmonic generation, APPL SPECTR, 55(1), 2001, pp. 16A-32A
Nanoengineered structures for holding and manipulating liposomes and cells
Authors: Wilson, CF Simpson, GJ Chiu, DT Stromberg, A Orwar, O Rodriguez, N Zare, RN
Citation: Cf. Wilson et al., Nanoengineered structures for holding and manipulating liposomes and cells, ANALYT CHEM, 73(4), 2001, pp. 787-791
Influence of substrate roughness on orientation measurements by second-harmonic generation
Authors: Simpson, GJ Rowlen, KL
Citation: Gj. Simpson et Kl. Rowlen, Influence of substrate roughness on orientation measurements by second-harmonic generation, CHEM P LETT, 317(3-5), 2000, pp. 276-281
Molecular orientation and angular distribution probed by angle-resolved absorbance and second harmonic generation
Authors: Simpson, GJ Westerbuhr, SG Rowlen, KL
Citation: Gj. Simpson et al., Molecular orientation and angular distribution probed by angle-resolved absorbance and second harmonic generation, ANALYT CHEM, 72(5), 2000, pp. 887-898
Orientation-insensitive methodology for second harmonic generation. 1. Theory
Authors: Simpson, GJ Rowlen, KL
Citation: Gj. Simpson et Kl. Rowlen, Orientation-insensitive methodology for second harmonic generation. 1. Theory, ANALYT CHEM, 72(15), 2000, pp. 3399-3406
Orientation-insensitive methodology for second harmonic generation. 2. Application to adsorption isotherm and kinetics measurements
Authors: Simpson, GJ Rowlen, KL
Citation: Gj. Simpson et Kl. Rowlen, Orientation-insensitive methodology for second harmonic generation. 2. Application to adsorption isotherm and kinetics measurements, ANALYT CHEM, 72(15), 2000, pp. 3407-3411
Measurement of orientation in organic thin films
Authors: Simpson, GJ Rowlen, KL
Citation: Gj. Simpson et Kl. Rowlen, Measurement of orientation in organic thin films, ACC CHEM RE, 33(11), 2000, pp. 781-789
Quantification of "local" surface orientation: Theory and experiment
Authors: Simpson, GJ Rowlen, KL
Citation: Gj. Simpson et Kl. Rowlen, Quantification of "local" surface orientation: Theory and experiment, J PHYS CH B, 103(9), 1999, pp. 1525-1531
Molecular orientation at surfaces: Surface roughness contributions to measurements based on linear dichroism
Authors: Simpson, GJ Rowlen, KL
Citation: Gj. Simpson et Kl. Rowlen, Molecular orientation at surfaces: Surface roughness contributions to measurements based on linear dichroism, J PHYS CH B, 103(19), 1999, pp. 3800-3811
Surface roughness by contact versus tapping mode atomic force microscopy
Authors: Simpson, GJ Sedin, DL Rowlen, KL
Citation: Gj. Simpson et al., Surface roughness by contact versus tapping mode atomic force microscopy, LANGMUIR, 15(4), 1999, pp. 1429-1434
Evaluation of molecular-scale roughness at liquid interfaces
Authors: Simpson, GJ Rowlen, KL
Citation: Gj. Simpson et Kl. Rowlen, Evaluation of molecular-scale roughness at liquid interfaces, CHEM P LETT, 309(1-2), 1999, pp. 117-122
An SHG magic angle: Dependence of second harmonic generation orientation measurements on the width of the orientation distribution
Authors: Simpson, GJ Rowlen, KL
Citation: Gj. Simpson et Kl. Rowlen, An SHG magic angle: Dependence of second harmonic generation orientation measurements on the width of the orientation distribution, J AM CHEM S, 121(11), 1999, pp. 2635-2636
Risultati: 1-12 |