Authors: Li, ZX Lu, JR Thomas, RK Weller, A Penfold, J Webster, JRP Sivia, DS Rennie, AR

Citation: Zx. Li et al., Conformal roughness in the adsorbed lamellar phase of aerosol-OT at the air-water and liquid-solid interfaces, LANGMUIR, 17(19), 2001, pp. 5858-5864

Authors: Larese, JZ Marero, DMY Sivia, DS Carlile, CJ

Citation: Jz. Larese et al., Tracking the evolution of interatomic potentials with high resolution inelastic neutron spectroscopy - art. no. 206102, PHYS REV L, 8720(20), 2001, pp. 6102

Authors: Sivia, DS David, WIF

Citation: Ds. Sivia et Wif. David, A Bayesian approach to phase extension, J PHYS CH S, 62(12), 2001, pp. 2119-2127

Authors: David, WIF Sivia, DS

Citation: Wif. David et Ds. Sivia, Background estimation using a robust Bayesian analysis, J APPL CRYS, 34, 2001, pp. 318-324

Authors: Sivia, DS

Citation: Ds. Sivia, The number of good reflections in a powder pattern, J APPL CRYS, 33, 2000, pp. 1295-1301