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Results: 1-3 |
Results: 3
Using in-line equipment condition and yield information for maintenance scheduling and dispatching in semiconductor wafer fabs
Authors: Sloan, TW Shanthikumar, JG
Citation: Tw. Sloan et Jg. Shanthikumar, Using in-line equipment condition and yield information for maintenance scheduling and dispatching in semiconductor wafer fabs, IIE TRANS, 34(2), 2002, pp. 191-209
Combined production and maintenance scheduling for a multiple-product, single-machine production system
Authors: Sloan, TW Shanthikumar, JG
Citation: Tw. Sloan et Jg. Shanthikumar, Combined production and maintenance scheduling for a multiple-product, single-machine production system, PROD OPER M, 9(4), 2000, pp. 379-399
Data reduction techniques and hypothesis testing for analysis of benchmarking data
Authors: Nickerson, JA Sloan, TW
Citation: Ja. Nickerson et Tw. Sloan, Data reduction techniques and hypothesis testing for analysis of benchmarking data, INT J PROD, 37(8), 1999, pp. 1717-1741
Risultati: 1-3 |