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Results:
1-3
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Results: 3
Metallic thin film thickness determination using electron probe microanalysis
Authors:
Campos, CS Coleoni, EA Trincavelli, JC Kaschny, J Hubbler, R Soares, MRF Vasconcellos, MAZ
Citation:
Cs. Campos et al., Metallic thin film thickness determination using electron probe microanalysis, X-RAY SPECT, 30(4), 2001, pp. 253-259
Diffusion of Pd in alpha-Ti studied by means of Rutherford back-scatteringand channelling techniques
Authors:
Behar, M Soares, MRF Dyment, F Perez, RA Balart, S
Citation:
M. Behar et al., Diffusion of Pd in alpha-Ti studied by means of Rutherford back-scatteringand channelling techniques, PHIL MAG A, 80(6), 2000, pp. 1319-1334
Diffusion and solubility of Au implanted into the AZ1350 photoresist
Authors:
Soares, MRF Kaschny, JRA dos Santos, JHR Amaral, L Behar, M Fink, D
Citation:
Mrf. Soares et al., Diffusion and solubility of Au implanted into the AZ1350 photoresist, NUCL INST B, 166, 2000, pp. 615-620
Risultati:
1-3
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