ACNP - Italian Periodicals Catalogue

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Results: 1-11 |

Results: 11

X-ray absorption studies of Fe-based nanocrystalline alloys

Authors: Sobczak, E Swilem, Y Dorozhkin, NN Nietubyc, R Dluzewski, P Slawska-Waniewska, A

Citation: E. Sobczak et al., X-ray absorption studies of Fe-based nanocrystalline alloys, J ALLOY COM, 328(1-2), 2001, pp. 57-63

X-ray absorption fine structure study of manganese compounds

Authors: Nietubyc, R Sobczak, E Attenkofer, KE

Citation: R. Nietubyc et al., X-ray absorption fine structure study of manganese compounds, J ALLOY COM, 328(1-2), 2001, pp. 126-131

XANES investigations of Pd-doped polyaniline

Authors: Sobczak, JW Sobczak, E Kosinski, A Bilinski, A

Citation: Jw. Sobczak et al., XANES investigations of Pd-doped polyaniline, J ALLOY COM, 328(1-2), 2001, pp. 132-134

Anomalous small angle X-ray scattering study of CdTe quantum dots in ZnTe

Authors: Nietubyc, R Sobczak, E Pelka, JB Mackowski, S Janik, E Karczewski, G Goerigk, G

Citation: R. Nietubyc et al., Anomalous small angle X-ray scattering study of CdTe quantum dots in ZnTe, J ALLOY COM, 328(1-2), 2001, pp. 206-210

m-Iodobenzoic acid complexes with selected metals: Molecular structure andantimicrobial activity

Authors: Koczon, P Lewandowski, W Lipinska, E Sobczak, E

Citation: P. Koczon et al., m-Iodobenzoic acid complexes with selected metals: Molecular structure andantimicrobial activity, J AGR FOOD, 49(6), 2001, pp. 2982-2986

Measurement of dislocation core distribution by digital processing of high-resolution transmission electron microscopy micrographs: a new technique for studying defects

Authors: Kret, S Dluzewski, P Dluzewski, P Sobczak, E

Citation: S. Kret et al., Measurement of dislocation core distribution by digital processing of high-resolution transmission electron microscopy micrographs: a new technique for studying defects, J PHYS-COND, 12(49), 2000, pp. 10313-10318

EXAFS investigations of Pd-doped conductive polymers

Authors: Sobczak, JW Sobczak, E Lesiak, B Palczewska, W Kosinski, A

Citation: Jw. Sobczak et al., EXAFS investigations of Pd-doped conductive polymers, J ALLOY COM, 286(1-2), 1999, pp. 98-102

EXAFS analysis of grain boundaries in nanocrystalline Fe85Zr7B6Cu2 alloys

Authors: Swilem, Y Sobczak, E Nietubyc, R Dluzewski, P Slawska-Waniewska, A

Citation: Y. Swilem et al., EXAFS analysis of grain boundaries in nanocrystalline Fe85Zr7B6Cu2 alloys, J ALLOY COM, 286(1-2), 1999, pp. 103-107

Multiple scattering calculations of FeK EXAFS for Fe surfaces and nanocrystals

Authors: Sobczak, E Dorozhkin, NN

Citation: E. Sobczak et Nn. Dorozhkin, Multiple scattering calculations of FeK EXAFS for Fe surfaces and nanocrystals, J ALLOY COM, 286(1-2), 1999, pp. 108-113

Electronic structure of silicon nitride

Authors: Nietubyc, R Sobczak, E Sipr, O Vackar, J Simunek, A

Citation: R. Nietubyc et al., Electronic structure of silicon nitride, J ALLOY COM, 286(1-2), 1999, pp. 148-152

Proceedings of the 4th International School and Symposium on Synchrotron Radiation in Natural Science, Ustron-Jaszowiec, Poland - June 15-20, 1998 - Preface

Authors: Paszkowicz, W Sobczak, E

Citation: W. Paszkowicz et E. Sobczak, Proceedings of the 4th International School and Symposium on Synchrotron Radiation in Natural Science, Ustron-Jaszowiec, Poland - June 15-20, 1998 - Preface, J ALLOY COM, 286(1-2), 1999, pp. XI-XII

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