Authors: Ruck, B Chong, Y Dittmann, R Engelhardt, A Oelze, B Sodtke, E Siegel, M Booij, WE Blamire, MG

Citation: B. Ruck et al., Measurement of the error rate of single flux quantum circuits with high temperature superconductors, IEEE APPL S, 9(2), 1999, pp. 3850-3853

Authors: Ruck, B Chong, Y Dittmann, R Engelhardt, A Sodtke, E Siegel, M

Citation: B. Ruck et al., A high-temperature superconducting delta-sigma modulator based on a multilayer technology with bicrystal Josephson junctions, SUPERCOND S, 12(11), 1999, pp. 701-703