Authors:
Lazarouk, S
Katsouba, S
Demianovich, A
Stanovski, V
Voitech, S
Vysotski, V
Ponomar, V
Citation: S. Lazarouk et al., Reliability of built in aluminum interconnection with low-epsilon dielectric based on porous anodic alumina, SOL ST ELEC, 44(5), 2000, pp. 815-818