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Results: 1-10 |
Results: 10

Authors: Stark, RW Drobek, T Heckl, WM
Citation: Rw. Stark et al., Thermomechanical noise of a free v-shaped cantilever for atomic-force microscopy, ULTRAMICROS, 86(1-2), 2001, pp. 207-215

Authors: Jamitzky, F Stark, RW Bunk, W Thalhammer, S Rath, C Aschenbrenner, T Morfill, GE Heckl, WM
Citation: F. Jamitzky et al., Scaling-index method as an image processing tool in scanning-probe microscopy, ULTRAMICROS, 86(1-2), 2001, pp. 241-246

Authors: Drobek, T Stark, RW Heckl, WM
Citation: T. Drobek et al., Determination of shear stiffness based on thermal noise analysis in atomicforce microscopy: Passive overtone microscopy - art. no. 045401, PHYS REV B, 6404(4), 2001, pp. 5401

Authors: Thalhammer, S Koehler, U Stark, RW Heckl, WM
Citation: S. Thalhammer et al., GTG banding pattern on human metaphase chromosomes revealed by high resolution atomic-force microscopy, J MICROSC O, 202, 2001, pp. 464-467

Authors: Gobbi, P Thalhammer, S Falconi, M Stark, RW Heckl, WM Mazzotti, G
Citation: P. Gobbi et al., Correlative high-resolution morphologic analysis of the three-dimensional organization of human chromosomes, SCANNING, 22(5), 2000, pp. 273-281

Authors: Stark, RW Heckl, WM
Citation: Rw. Stark et Wm. Heckl, Fourier transformed atomic force microscopy: tapping mode atomic force microscopy beyond the Hookian approximation, SURF SCI, 457(1-2), 2000, pp. 219-228

Authors: Gottlich, H Stark, RW Pedarnig, JD Heckl, WM
Citation: H. Gottlich et al., Noncontact scanning force microscopy based on a modified tuning fork sensor, REV SCI INS, 71(8), 2000, pp. 3104-3107

Authors: Stark, M Stark, RW Heckl, WM Guckenberger, R
Citation: M. Stark et al., Spectroscopy of the anharmonic cantilever oscillations in tapping-mode atomic-force microscopy, APPL PHYS L, 77(20), 2000, pp. 3293-3295

Authors: Richards, JR Johnson, EB Stark, RW Derlet, RW
Citation: Jr. Richards et al., Methamphetamine abuse and rhabdomyolysis in the ED: A 5-year study, AM J EMER M, 17(7), 1999, pp. 681-685

Authors: Stark, RW Drobek, T Heckl, WM
Citation: Rw. Stark et al., Tapping-mode atomic force microscopy and phase-imaging in higher eigenmodes, APPL PHYS L, 74(22), 1999, pp. 3296-3298
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