Citation: T. Drobek et al., Determination of shear stiffness based on thermal noise analysis in atomicforce microscopy: Passive overtone microscopy - art. no. 045401, PHYS REV B, 6404(4), 2001, pp. 5401
Authors:
Thalhammer, S
Koehler, U
Stark, RW
Heckl, WM
Citation: S. Thalhammer et al., GTG banding pattern on human metaphase chromosomes revealed by high resolution atomic-force microscopy, J MICROSC O, 202, 2001, pp. 464-467
Authors:
Gobbi, P
Thalhammer, S
Falconi, M
Stark, RW
Heckl, WM
Mazzotti, G
Citation: P. Gobbi et al., Correlative high-resolution morphologic analysis of the three-dimensional organization of human chromosomes, SCANNING, 22(5), 2000, pp. 273-281
Citation: Rw. Stark et Wm. Heckl, Fourier transformed atomic force microscopy: tapping mode atomic force microscopy beyond the Hookian approximation, SURF SCI, 457(1-2), 2000, pp. 219-228
Authors:
Stark, M
Stark, RW
Heckl, WM
Guckenberger, R
Citation: M. Stark et al., Spectroscopy of the anharmonic cantilever oscillations in tapping-mode atomic-force microscopy, APPL PHYS L, 77(20), 2000, pp. 3293-3295