Authors: Park, W Baxter, DV Steenwyk, S Moraru, I Pratt, WP Bass, J

Citation: W. Park et al., Measurement of resistance and spin-memory loss (spin relaxation) at interfaces using sputtered current perpendicular-to-plane exchange-biased spin valves, PHYS REV B, 62(2), 2000, pp. 1178-1185