Authors:
Segal, AS
Galyukov, AO
Kondratyev, AV
Sid'ko, AP
Karpov, SY
Makarov, YN
Siebert, W
Storck, P
Citation: As. Segal et al., Comparison of silicon epitaxial growth on the 200-and 300-mm wafers from trichlorosilane in Centura reactors, MICROEL ENG, 56(1-2), 2001, pp. 93-98
Citation: P. Storck et al., Measurement of differences in snow accumulation, melt, and micrometeorology due to forest harvesting, NW SCI, 73, 1999, pp. 87-101