Authors: Himcinschi, C Friedrich, M Murray, C Streiter, I Schulz, SE Gessner, T Zahn, DRT

Citation: C. Himcinschi et al., Characterization of silica xerogel films by variable-angle spectroscopic ellipsometry and infrared spectroscopy, SEMIC SCI T, 16(9), 2001, pp. 806-811

Authors: Schulz, SE Koerner, H Murray, C Streiter, I Gessner, T

Citation: Se. Schulz et al., Influence of barrier and cap layer deposition on the properties of capped and non-capped porous silicon oxide, MICROEL ENG, 55(1-4), 2001, pp. 45-52

Authors: Flannery, CM Murray, C Streiter, I Schulz, SE

Citation: Cm. Flannery et al., Characterization of thin-film aerogel porosity and stiffness with laser-generated surface acoustic waves, THIN SOL FI, 388(1-2), 2001, pp. 1-4