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Authors: Stuik, R Louis, E Yakshin, AE Gorts, PC Maas, ELG Bijkerk, F Schmitz, D Scholze, F Ulm, G Haidl, M
Citation: R. Stuik et al., Peak and Integrated reflectivity, wavelength and gamma optimization of Mo/Si, and Mo/Be multilayer, multielement optics for extreme ultraviolet lithography, J VAC SCI B, 17(6), 1999, pp. 2998-3002

Authors: Stuik, R Shmaenok, LA Fledderus, H Andreev, SS Shamov, EA Zuev, SY Salashchenko, NN Bijkerk, F
Citation: R. Stuik et al., Development of low-energy x-ray fluorescence micro-distribution analysis using a laser plasma x-ray source and multilayer optics?, J ANAL ATOM, 14(3), 1999, pp. 387-390
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