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Results: 1-7 |
Results: 7
pH-controlled adsorption of polyelectrolyte diblock copolymers at the solid/liquid interface
Authors: Styrkas, DA Butun, V Lu, JR Keddie, JL Armes, SP
Citation: Da. Styrkas et al., pH-controlled adsorption of polyelectrolyte diblock copolymers at the solid/liquid interface, LANGMUIR, 16(14), 2000, pp. 5980-5986
Reduction of oxygen content in high-purity tin powders
Authors: Styrkas, AD Styrkas, DA
Citation: Ad. Styrkas et Da. Styrkas, Reduction of oxygen content in high-purity tin powders, INORG MATER, 36(2), 2000, pp. 137-139
Purification of palladium by AC electrodissolution and electrodeposition
Authors: Styrkas, AD Styrkas, DA
Citation: Ad. Styrkas et Da. Styrkas, Purification of palladium by AC electrodissolution and electrodeposition, INORG MATER, 36(11), 2000, pp. 1114-1117
Azeotropy and anomaluos kinetics of alternating current rhodium dissolution in Water-HCl systems
Authors: Styrkas, AD Styrkas, DA
Citation: Ad. Styrkas et Da. Styrkas, Azeotropy and anomaluos kinetics of alternating current rhodium dissolution in Water-HCl systems, DOKL AKAD N, 366(5), 1999, pp. 652-654
Two novel methods of the production of high purity tin powders with reduced oxygen content
Authors: Styrkas, AD Styrkas, DA
Citation: Ad. Styrkas et Da. Styrkas, Two novel methods of the production of high purity tin powders with reduced oxygen content, POWD TECH, 104(2), 1999, pp. 164-168
Equilibrium swelling of hydrophilic polyacrylates in humid environments
Authors: Chen, WL Shull, KR Papatheodorou, T Styrkas, DA Keddie, JL
Citation: Wl. Chen et al., Equilibrium swelling of hydrophilic polyacrylates in humid environments, MACROMOLEC, 32(1), 1999, pp. 136-144
Structure of self-assembled layers on silicon: Combined use of spectroscopic variable angle ellipsometry, neutron reflection, and atomic force microscopy
Authors: Styrkas, DA Keddie, JL Lu, JR Su, TJ Zhdan, PA
Citation: Da. Styrkas et al., Structure of self-assembled layers on silicon: Combined use of spectroscopic variable angle ellipsometry, neutron reflection, and atomic force microscopy, J APPL PHYS, 85(2), 1999, pp. 868-875
Risultati: 1-7 |