Authors: Szpala, S Simpson, PJ

Citation: S. Szpala et Pj. Simpson, Charge states of divacancies in self-implanted doped Si, J APPL PHYS, 89(11), 2001, pp. 5991-5996

Authors: Adam, LS Law, ME Szpala, S Simpson, PJ Lawther, D Dokumaci, O Hegde, S

Citation: Ls. Adam et al., Experimental identification of nitrogen-vacancy complexes in nitrogen implanted silicon, APPL PHYS L, 79(5), 2001, pp. 623-625