Authors: Rhayem, J Rigaud, D Valenza, M Szydlo, N Lebrun, H

Citation: J. Rhayem et al., 1/f noise modeling in long channel amorphous silicon thin film transistors, J APPL PHYS, 87(4), 2000, pp. 1983-1989

Authors: Rhayem, J Rigaud, D Valenza, M Szydlo, N Lebrun, H

Citation: J. Rhayem et al., 1/f noise in amorphous silicon thin film transistors: effect of scaling down, SOL ST ELEC, 43(4), 1999, pp. 713-721