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Results:
1-18
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Results: 18
Authors:
GUNNELLA R
VEUILLEN JY
BERTHET A
TAN TAN
Citation: R. Gunnella et al., ELECTRONIC AND STRUCTURAL-PROPERTIES OF THE 6H-SIC(0001) SURFACES, Surface review and letters, 5(1), 1998, pp. 187-191
Authors:
GUNNELLA R
VEUILLEN JY
TAN TAN
FLANK AM
Citation: R. Gunnella et al., X-RAY-ABSORPTION SPECTROSCOPY STUDY OF ATOMIC-STRUCTURE OF EPITAXIAL ERSI1.7(0001) ON SI(111), Physical review. B, Condensed matter, 57(7), 1998, pp. 4154-4159
Authors:
HAFIDI K
IJDIYAOU Y
AZIZAN M
AMEZIANE EL
OUTZOURHIT A
TAN TAN
BRUNEL M
Citation: K. Hafidi et al., INTERACTION OF OXYGEN WITH (ER- FORMATION OF ERBIUM PYROSILICATE ER2SI2O7(SI) ), Applied surface science, 108(2), 1997, pp. 251-256
Authors:
MURET P
TAN TAN
FRANGIS N
VANLANDUYT J
Citation: P. Muret et al., UNPINNING OF THE FERMI-LEVEL AT ERBIUM SILICIDE SILICON INTERFACES, Physical review. B, Condensed matter, 56(15), 1997, pp. 9286-9289
Authors:
MARTINGAGO JA
VEUILLEN JY
CASADO C
TAN TAN
Citation: Ja. Martingago et al., SURFACE CHARACTER IN THE EXPERIMENTAL FERMI-SURFACE OF EPITAXIAL ERSI1.7(0001) BY PHOTOEMISSION SPECTROSCOPY, Physical review. B, Condensed matter, 55(8), 1997, pp. 5129-5135
Authors:
MARTINGAGO JA
VEUILLEN JY
CASADO C
TAN TAN
Citation: Ja. Martingago et al., EXPERIMENTAL FERMI-SURFACE DETERMINATION OF EPITAXIAL ERSI1.7(0001) ON SI(111), Surface science, 377(1-3), 1997, pp. 172-176
Authors:
KENNOU S
LADAS S
GRIMALDI MG
TAN TAN
VEUILLEN JY
Citation: S. Kennou et al., OXIDATION OF THIN ERBIUM AND ERBIUM SILICIDE OVERLAYERS IN CONTACT WITH SILICON-OXIDE FILMS THERMALLY GROWS ON SILICON, Applied surface science, 102, 1996, pp. 142-146
Authors:
ALI I
MURET P
TAN TAN
Citation: I. Ali et al., PROPERTIES OF SEMICONDUCTING RHENIUM SILICIDE THIN-FILMS GROWN EPITAXIALLY ON SILICON(111), Applied surface science, 102, 1996, pp. 147-150
Authors:
SIOKOU A
KENNOU S
LADAS S
TAN TAN
VEUILLEN JY
Citation: A. Siokou et al., GROWTH AND CHARACTERIZATION OF THE RE SI(111) INTERFACE/, Surface science, 352, 1996, pp. 628-633
Authors:
IJDIYAOU Y
HAFIDI K
AZIZAN M
AMEZIANE EL
PATRAT G
BRUNEL M
ORTEGA L
TAN TAN
Citation: Y. Ijdiyaou et al., THE FORMATION OF SPUTTERED TA A-SI AND A-SI/TA INTERFACES IN A-SI/TA/A-SI/C-SI STRUCTURE/, Thin solid films, 266(2), 1995, pp. 224-228
Authors:
ECHCHAMIKH E
AMEZIANE EL
BENNOUNA A
AZIZAN M
TAN TAN
Citation: E. Echchamikh et al., STRUCTURAL AND OPTICAL-PROPERTIES OF RF-SPUTTERED SIXC1-X-O FILMS, Thin solid films, 259(1), 1995, pp. 18-24
Authors:
TAN TAN
VEUILLEN JY
MURET P
KENNOU S
SIOKOU A
LADAS S
RAZAFINDRAMISA FL
BRUNEL M
Citation: Tan. Tan et al., SEMICONDUCTING RHENIUM SILICIDE THIN-FILMS ON SI(111), Journal of applied physics, 77(6), 1995, pp. 2514-2518
Authors:
TUILIER MH
PIRRI C
WETZEL P
GEWINNER G
VEUILLEN JY
TAN TAN
Citation: Mh. Tuilier et al., ATOMIC-STRUCTURE OF EPITAXIAL ER SILICIDES GROWN ON SI(111) STUDIED BY SURFACE EXTENDED X-RAY-ABSORPTION FINE-STRUCTURE, Surface science, 309, 1994, pp. 710-715
Authors:
KENNOU S
VEUILLEN JY
TAN TAN
Citation: S. Kennou et al., FORMATION AND ELECTRONIC-PROPERTIES OF ERBIUM SILICIDE ON SI(100), Surface science, 309, 1994, pp. 258-263
Authors:
VEUILLEN JY
DANTERROCHES C
TAN TAN
Citation: Jy. Veuillen et al., GROWTH OF SILICON THIN-FILMS ON ERBIUM SILICIDE BY SOLID-PHASE EPITAXY, Journal of applied physics, 75(1), 1994, pp. 223-226
Authors:
IJDIYAOU Y
AZIZAN M
AMEZIANE EL
BRUNEL M
TAN TAN
Citation: Y. Ijdiyaou et al., ON THE FORMATION OF ERBIUM SILICIDE IN A-SI ER/A-SI/C-SI STRUCTURES/, Applied surface science, 70-1, 1993, pp. 447-451
Authors:
TAN TAN
VEUILLEN JY
KENNOU S
MAGAUD L
Citation: Tan. Tan et al., SI ERSI1.7 INTERFACES AND SI REEPITAXY ON THE ERSI1.7/SI STRUCTURE/, Applied surface science, 70-1, 1993, pp. 520-525
Authors:
VEUILLEN JY
TAN TAN
LOLLMAN DBB
Citation: Jy. Veuillen et al., ELECTRONIC-STRUCTURE OF ERBIUM SILICIDE ULTRA-THIN FILMS, Surface science, 293(1-2), 1993, pp. 86-92
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