Authors:
DIMEO F
CAVICCHI RE
SEMANCIK S
SUEHLE JS
TEA NH
SMALL J
ARMSTRONG JT
KELLIHER JT
Citation: F. Dimeo et al., IN-SITU CONDUCTIVITY CHARACTERIZATION OF OXIDE THIN-FILM GROWTH PHENOMENA ON MICROHOTPLATES, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 16(1), 1998, pp. 131-138
Authors:
MILANOVIC V
GAITAN M
BOWEN ED
TEA NH
ZAGHLOUL ME
Citation: V. Milanovic et al., THERMOELECTRIC-POWER SENSOR FOR MICROWAVE APPLICATIONS BY COMMERCIAL CMOS FABRICATION, IEEE electron device letters, 18(9), 1997, pp. 450-452