Authors: CHIM WK CHAN DSH TAO JM LOU CL LEANG SE TEOW CK

Citation: Wk. Chim et al., DISTINGUISHING THE EFFECTS OF OXIDE TRAPPED CHARGES AND INTERFACE STATES IN DDD AND LATID NMOSFETS USING PHOTON-EMISSION SPECTROSCOPY, Journal of physics. D, Applied physics, 30(17), 1997, pp. 2411-2420