Citation: Sv. Teplov et Da. Yakovlev, ABOUT THE CHANGES OF CONCENTRATION PROFIL ES IN A BINARY ALLOY DURINGCHEMOSORPTION, UKRAINSKII FIZICHESKII ZHURNAL, 39(5-6), 1994, pp. 742-745
Citation: Y. Wang et al., DETERMINATION OF THE STRUCTURE OF SUBSURFACE LAYERS BY MEANS OF COAXIAL TIME-OF-FLIGHT SCATTERING AND RECOILING SPECTROMETRY (TOF-SARS), Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 90(1-4), 1994, pp. 237-242
Authors:
TEPLOV SV
ZASTAVNJUK VV
BYKOV V
RABALAIS JW
Citation: Sv. Teplov et al., COMPUTER-SIMULATIONS OF ION-SCATTERING AND RECOILING BLOCKING PATTERNS FOR SURFACE-STRUCTURE ANALYSIS, Surface science, 310(1-3), 1994, pp. 436-450
Authors:
WANG Y
TEPLOV SV
ZAPOROZCHENKO OS
BYKOV V
RABALAIS JW
Citation: Y. Wang et al., COAXIAL SCATTERING PROBE OF THE SURFACE AND SUBSURFACE STRUCTURE OF THE SI(100)-(2 X-1) AND SI(100)-(1 X 1)-H PHASES, Surface science, 296(2), 1993, pp. 213-223