Authors: THANIKASALAM P WHIDDEN TK FERRY DK

Citation: P. Thanikasalam et al., OXIDATION OF SILICON (100) - EXPERIMENTAL-DATA VERSUS A UNIFIED CHEMICAL-MODEL, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 14(4), 1996, pp. 2840-2844

Authors: WHIDDEN TK THANIKASALAM P RACK MJ FERRY DK

Citation: Tk. Whidden et al., INITIAL OXIDATION OF SILICON(100) - A UNIFIED CHEMICAL-MODEL FOR THINAND THICK OXIDE-GROWTH RATES AND INTERFACIAL STRUCTURE, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 13(4), 1995, pp. 1618-1625

Authors: THANIKASALAM P VENKATASUBRAMANIAN R CAHAY M

Citation: P. Thanikasalam et al., ANALYTICAL EXPRESSIONS FOR TUNNELING TIME THROUGH SINGLE AND DOUBLE-BARRIER STRUCTURES, IEEE journal of quantum electronics, 29(9), 1993, pp. 2451-2458