Authors: WU F MCLAURIN AW HENSON KE MANAGHAN DG THOMASSON SL

Citation: F. Wu et al., THE EFFECTS OF THE PROCESS PARAMETERS ON THE ELECTRICAL AND MICROSTRUCTURE CHARACTERISTICS OF THE CRSI THIN RESISTOR FILMS - PART I, Thin solid films, 332(1-2), 1998, pp. 418-422

Authors: THOMASSON SL GOULD CM

Citation: Sl. Thomasson et Cm. Gould, DIRECT-COUPLED DC SQUID MAGNETOMETER FOR ULTRALOW TEMPERATURE NMR, Czechoslovak journal of Physics, 46, 1996, pp. 2849-2850

Authors: THOMASSON SL GOULD CM

Citation: Sl. Thomasson et Cm. Gould, HIGH SLEW RATE LARGE BANDWIDTH INTEGRATED DE SQUID MAGNETOMETER FOR NMR APPLICATIONS, IEEE transactions on applied superconductivity, 5(2), 1995, pp. 3222-3225

Authors: THOMASSON SL GOULD CM

Citation: Sl. Thomasson et Cm. Gould, 1-MHZ BANDWIDTH TRUE NMR SQUID AMPLIFIER, Journal of low temperature physics, 101(1-2), 1995, pp. 243-248