AAAAAA

   
Results: 1-5 |
Results: 5

Authors: BIRKELUND K THOMSEN EV RASMUSSEN JP HANSEN O TANG PT MOLLER P GREY F
Citation: K. Birkelund et al., NEW APPROACHES TO ATOMIC-FORCE MICROSCOPE LITHOGRAPHY ON SILICON, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 15(6), 1997, pp. 2912-2915

Authors: THOMSEN EV CHRISTENSEN C ANDERSEN CR PEDERSEN EV EGINTON PN HANSEN O PETERSEN JW
Citation: Ev. Thomsen et al., COLD-WALLED UHV CVD BATCH REACTOR FOR THE GROWTH OF SI1-XGEX LAYERS/, Thin solid films, 294(1-2), 1997, pp. 72-75

Authors: HANSEN JL SHIRYAEV SY THOMSEN EV
Citation: Jl. Hansen et al., IMPROVEMENT OF THE MORPHOLOGICAL QUALITY OF THE SI SURFACE USING AN OPTIMIZED IN-SITU OXIDE REMOVAL PROCEDURE PRIOR TO MBE GROWTH, Journal of crystal growth, 157(1-4), 1995, pp. 317-322

Authors: THOMSEN EV HANSEN O HARREKILDEPETERSEN K HANSEN JL SHIRYAEV SY LARSEN AN
Citation: Ev. Thomsen et al., THERMAL-STABILITY OF HIGHLY SB-DOPED MOLECULAR-BEAM EPITAXY SILICON GROWN AT LOW-TEMPERATURES - STRUCTURAL AND ELECTRICAL CHARACTERIZATION, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 12(5), 1994, pp. 3016-3022

Authors: THOMSEN EV JORGENSEN B ONSGAARD J
Citation: Ev. Thomsen et al., ADSORPTION AND REACTIVITY OF CO2 ON THE K CU(110) INTERFACE AND THE EFFECT OF PHOTON IRRADIATION/, Surface science, 304(1-2), 1994, pp. 85-97
Risultati: 1-5 |