Authors:
TOMOHISA S
NAKATSUKA H
TACHIKI M
KOBAYASHI T
Citation: S. Tomohisa et al., MORPHOLOGICAL-STUDY OF YBA2CU3OY THIN-FILMS GROWN BY EXCIMER-LASER ABLATION METHOD, IEICE transactions on electronics, E79C(9), 1996, pp. 1264-1268
Citation: T. Ashida et al., INTERFACIAL DEGRADATION OF INSULATOR YBA2CU3OY HETEROSTRUCTURE DUE TOMUTUAL DIFFUSION OF CONSTITUENT ATOMS, JPN J A P 2, 34(1A), 1995, pp. 23-26