Authors: TREPK T ZORN M ZETTLER JT KLEIN M RICHTER W

Citation: T. Trepk et al., SPECTROSCOPIC ELLIPSOMETRY APPLIED FOR IN-SITU CONTROL OF LATTICE-MATCHED III-V GROWTH IN MOVPE, Thin solid films, 313, 1998, pp. 496-500

Authors: ZETTLER JT PRISTOVSEK M TREPK T SHKREBTII A STEIMETZ E ZORN M RICHTER W

Citation: Jt. Zettler et al., RESPONSE OF THE SURFACE DIELECTRIC FUNCTION TO DYNAMIC SURFACE MODIFICATIONS - APPLICATION OF REFLECTANCE ANISOTROPY SPECTROSCOPY AND SPECTROSCOPIC ELLIPSOMETRY, Thin solid films, 313, 1998, pp. 537-543

Authors: ZORN M TREPK T ZETTLER JT JUNNO B MEYNE C KNORR K WETHKAMP T KLEIN M MILLER M RICHTER W SAMUELSON L

Citation: M. Zorn et al., TEMPERATURE-DEPENDENCE OF THE INP(001) BULK AND SURFACE DIELECTRIC FUNCTION, Applied physics A: Materials science & processing, 65(3), 1997, pp. 333-339

Authors: STEIMETZ E ZETTLER JT SCHIENLE F TREPK T WETHKAMP T RICHTER W SIEBER I

Citation: E. Steimetz et al., TN SITU MONITORING OF INAS-ON-GAAS QUANTUM-DOT FORMATION IN MOVPE BY REFLECTANCE-ANISOTROPY-SPECTROSCOPY AND ELLIPSOMETRY, Applied surface science, 107, 1996, pp. 203-211

Authors: ZETTLER JT TREPK T SPANOS L HU YZ RICHTER W

Citation: Jt. Zettler et al., HIGH-PRECISION UV-VISIBLE NEAR-IR STOKES VECTOR SPECTROSCOPY, Thin solid films, 234(1-2), 1993, pp. 402-407

Authors: ZETTLER JT MIKKELSEN H TREPK T LEO K KURZ H RICHTER W

Citation: Jt. Zettler et al., MODULATED ELLIPSOMETRY FOR CHARACTERIZATION OF MULTIPLE-QUANTUM WELLSAND SUPERLATTICES, Thin solid films, 233(1-2), 1993, pp. 112-116