Authors: LE HA TSO NC ROST TA KIM CU

Citation: Ha. Le et al., INFLUENCE OF W-VIA ON THE MECHANISM OF ELECTROMIGRATION FAILURE IN AL-0.5 CU INTERCONNECTS, Applied physics letters, 72(22), 1998, pp. 2814-2816

Authors: LE HA TSO NC MCPHERSON JW

Citation: Ha. Le et al., ELECTROMIGRATION PERFORMANCE OF W-PLUG VIA-FED LEAD STRUCTURES, Journal of the Electrochemical Society, 144(7), 1997, pp. 2522-2525