Authors: Kimura, M Nozawa, R Inoue, S Shimoda, T Lui, BOK Tam, SWB Migliorato, P

Citation: M. Kimura et al., Extraction of trap states at the oxide-silicon interface and grain boundary for polycrystalline silicon thin-film transistors, JPN J A P 1, 40(9A), 2001, pp. 5227-5236

Authors: Kimura, M Nozawa, R Inoue, S Shimoda, T Lui, BOK Tam, SWB Migliorato, P

Citation: M. Kimura et al., Extraction of trap states at the oxide-silicon interface and grain boundary in polycrystalline silicon thin-film transistors, JPN J A P 1, 40(1), 2001, pp. 112-113

Authors: Migliorato, P Tam, SWB Lui, OKB Shimoda, T

Citation: P. Migliorato et al., Determination of the surface potential in thin-film transistors from C-V measurements, J APPL PHYS, 89(11), 2001, pp. 6449-6452

Authors: Lui, OKB Tam, SWB Migliorato, P Shimoda, T

Citation: Okb. Lui et al., Method for the determination of bulk and interface density of states in thin-film transistors, J APPL PHYS, 89(11), 2001, pp. 6453-6458

Authors: Tam, SWB Migliorato, P Lui, OKB Quinn, MJ

Citation: Swb. Tam et al., Observation of "capacitance overshoot" in the transient current measurement of polysilicon TFT's, IEEE DEVICE, 46(1), 1999, pp. 134-138