Citation: Y. Taniyasu et A. Yoshikawa, In-situ monitoring of surface stoichiometry and growth kinetics study of GaN (0001) in MOVPE by spectroscopic ellipsometry, J ELEC MAT, 30(11), 2001, pp. 1402-1407
Authors:
Taniyasu, Y
Suzuki, K
Lim, DH
Jia, AW
Shimotomai, M
Kato, Y
Kobayashi, M
Yoshikawa, A
Takahashi, K
Citation: Y. Taniyasu et al., Cubic InGaN/GaN double-heterostructure light emitting diodes grown on GaAs(001) substrates by MOVPE, PHYS ST S-A, 180(1), 2000, pp. 241-246
Authors:
Kazama, T
Yasunaga, F
Taniyasu, Y
Jia, A
Kato, Y
Kobayashi, M
Yoshikawa, A
Takahashi, K
Citation: T. Kazama et al., Cross-sectional scanning tunneling microscopy characterization of cubic GaN epilayers grown on (001) GaAs, PHYS ST S-A, 180(1), 2000, pp. 345-350
Authors:
Taniyasu, Y
Watanabe, Y
Lim, DH
Jia, AW
Shimotomai, M
Kato, Y
Kobayashi, M
Yoshikawa, A
Takahashi, K
Citation: Y. Taniyasu et al., Structural defects of cubic InGaN/GaN heterostructure grown on GaAs(001) substrate by MOVPE, PHYS ST S-A, 176(1), 1999, pp. 397-400