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Citation: D. Tanooka et al., Color-imaging ellipsometer: High-speed characterization of in-plane distribution of film thickness at nano-scale, JPN J A P 1, 40(2A), 2001, pp. 877-880

Authors: Tanooka, D Itoh, S Hirosawa, I

Citation: D. Tanooka et al., Wide-viewing observation and high-spatial resolution characterization of rubbed polyimide film for liquid crystal display, MOLEC CRYST, 367, 2001, pp. 3523-3532

Authors: Tanooka, D Itoh, S Hirosawa, I

Citation: D. Tanooka et al., New characterization technique for rubbed polyimide film for liquid crystal display, JPN J A P 1, 38(11), 1999, pp. 6454-6455