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Results: 2
On the effects of hot carriers on the RF characteristics of Si/SiGe heterojunction bipolar transistors
Authors: Borgarino, M Tartarin, JG Kuchenbecker, J Parra, T Lafontaine, H Kovacic, T Plana, R Graffeuil, J
Citation: M. Borgarino et al., On the effects of hot carriers on the RF characteristics of Si/SiGe heterojunction bipolar transistors, IEEE MICR G, 10(11), 2000, pp. 466-468
A cost-effective technique for extending the low-frequency range of a microwave noise parameter test set
Authors: Escotte, L Tartarin, JG Graffeuil, J
Citation: L. Escotte et al., A cost-effective technique for extending the low-frequency range of a microwave noise parameter test set, IEEE INSTR, 48(4), 1999, pp. 830-834
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