Authors: Kechagias, VG Gioti, M Logothetidis, S Benferhat, R Teer, D

Citation: Vg. Kechagias et al., 'Real-time' multiwavelength ellipsometry diagnostics for monitoring dry etching of Si and TiNx deposition, THIN SOL FI, 364(1-2), 2000, pp. 213-219

Authors: Rigato, V Maggioni, G Boscarino, D Sangaletti, L Depero, L Fox, VC Teer, D Santini, C

Citation: V. Rigato et al., A study of the structural and mechanical properties of Ti-MoS2 coatings deposited by closed field unbalanced magnetron sputter ion plating, SURF COAT, 119, 1999, pp. 176-183

Authors: Rigato, V Maggioni, G Boscarino, D Mariotto, G Bontempi, E Jones, AHS Camino, D Teer, D Santini, C

Citation: V. Rigato et al., Ion beam analysis and Raman characterisation of coatings deposited by cosputtering carbon and chromium in a closed field unbalanced magnetron sputterion plating system, SURF COAT, 119, 1999, pp. 580-584

Authors: Fox, V Hampshire, J Teer, D

Citation: V. Fox et al., MoS2/metal composite coatings deposited by closed-field unbalanced magnetron sputtering: tribological properties and industrial uses, SURF COAT, 112(1-3), 1999, pp. 118-122

Authors: Laing, K Hampshire, J Teer, D Chester, G

Citation: K. Laing et al., The effect of ion current density on the adhesion and structure of coatings deposited by magnetron sputter ion plating, SURF COAT, 112(1-3), 1999, pp. 177-180