Authors:
Skarman, B
Wallenberg, LR
Jacobsen, SN
Helmersson, U
Thelander, C
Citation: B. Skarman et al., Evaluation of intermittent contact mode AFM probes by HREM and using atomically sharp CeO2 ridges as tip characterizer, LANGMUIR, 16(15), 2000, pp. 6267-6277