Authors: Reiche, R Thielsch, R Oswald, S Wetzig, K

Citation: R. Reiche et al., XPS studies and factor analysis of PbS nanocrystal-doped SiO2 thin films, J ELEC SPEC, 104(1-3), 1999, pp. 161-171

Authors: Mobius, A Frenzel, C Thielsch, R Rosenbaum, R Adkins, CJ Schreiber, M Bauer, HD Grotzschel, R Hoffmann, V Krieg, T Matz, N Vinzelberg, H Witcomb, M

Citation: A. Mobius et al., Metal-insulator transition in amorphous Si1-xNix: Evidence for Mott's minimum metallic conductivity, PHYS REV B, 60(20), 1999, pp. 14209-14223

Authors: Hoffmann, V Kurt, R Kammer, K Thielsch, R Wirth, T Beck, U

Citation: V. Hoffmann et al., Interference phenomena at transparent layers in glow discharge optical emission spectrometry, APPL SPECTR, 53(8), 1999, pp. 987-990