Authors: Pelissonnier-Grosjean, C Fournier, D Thorel, A

Citation: C. Pelissonnier-grosjean et al., Thermal resistance of grain boundary interfaces in polycrystalline aluminum nitride, J PHYS IV, 9(P4), 1999, pp. 201-206

Authors: Lesueur, J Aprili, M Grison, X Ayache, J Kim, SJ Thorel, A

Citation: J. Lesueur et al., Tunnel and Josephson effects in high supercritical temperature superconductors: Role of interfaces, J PHYS IV, 9(P4), 1999, pp. 207-216

Authors: Montardi, Y Witz, C Normand, L Thorel, A

Citation: Y. Montardi et al., Local measurement of dielectric and optical properties by electron energy loss spectrometry, J PHYS IV, 9(P4), 1999, pp. 217-222

Authors: Fournier, D Forget, B Plamann, K Bisson, JF Pelissonnier-Grosjean, C Thorel, A

Citation: D. Fournier et al., Photothermal methods : application to diamond, aluminium nitride and zirconia, REV METALL, 96(5), 1999, pp. 641-648

Authors: Ayache, J Thorel, A Lesuer, J Dahmen, U

Citation: J. Ayache et al., Characterization of three-dimensional grain boundary topography in a YBa2Cu3O7-d thin film bicrystal grown on a SrTiO3 substrate, J APPL PHYS, 84(9), 1998, pp. 4921-4928